Advanced Characterization Techniques

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Introduction to the course: Relevance of advanced characterization to materials development, scientific understanding of phenomena in materials technology – Advanced Diffraction Techniques – Introduction; X-Ray, their production &properties – Review of basic diffraction theory – Various SAXS techniques and its applications in characterizing material – SAXS – GISAXS – LEED and RHEED – EXAFS, SEXAFS/NEXAFS – Properties of neutron radiation; neutron sources – Small angle neutron scattering; Examples – Advanced Surface Characterization Techniques: XPS, AES & SIMS – Importance of surface characterization techniques – Physical principles of XPS, Photoelectric effects – Instrumentation, XPS patterns; Spin orbital Splitting; Quantitative analysis, Chemical effect, Chemical shift, XPS imaging Auger electron generation; Principle, Chemical effect, Quantitative analysis, Depth profiling, Applications – Static and Dynamic Secondary Ion Mass, Common modes of analysis, Depth Profiling, quantitative and Qualitative analysis – Comparison surface analysis techniques – Advanced Spectroscopic Techniques: Introduction; Electromagnetic spectroscopy; UV-Visible Spectroscopy; Photo-luminescence spectroscopy; Infra-red spectroscopy – Raman; STEM; EELS – Advanced Microscopic Techniques:Introduction; Electron-materials interactions – TEM: HR, HAADF, STEM, In-situ TEM – SEM, EBSD, In-situ SEM – AFM, STM – Laser Confocal Microscopy

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