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Advanced Characterization Techniques

IIT Kanpur, , Prof. Krishanu Biswas

Updated On 02 Feb, 19

Overview

Introduction to the course: Relevance of advanced characterization to materials development, scientific understanding of phenomena in materials technology - Advanced Diffraction Techniques - Introduction; X-Ray, their production &properties - Review of basic diffraction theory - Various SAXS techniques and its applications in characterizing material - SAXS - GISAXS - LEED and RHEED - EXAFS, SEXAFS/NEXAFS - Properties of neutron radiation; neutron sources - Small angle neutron scattering; Examples - Advanced Surface Characterization Techniques: XPS, AES & SIMS - Importance of surface characterization techniques - Physical principles of XPS, Photoelectric effects - Instrumentation, XPS patterns; Spin orbital Splitting; Quantitative analysis, Chemical effect, Chemical shift, XPS imaging Auger electron generation; Principle, Chemical effect, Quantitative analysis, Depth profiling, Applications - Static and Dynamic Secondary Ion Mass, Common modes of analysis, Depth Profiling, quantitative and Qualitative analysis - Comparison surface analysis techniques - Advanced Spectroscopic Techniques: Introduction; Electromagnetic spectroscopy; UV-Visible Spectroscopy; Photo-luminescence spectroscopy; Infra-red spectroscopy - Raman; STEM; EELS - Advanced Microscopic Techniques:Introduction; Electron-materials interactions - TEM: HR, HAADF, STEM, In-situ TEM - SEM, EBSD, In-situ SEM - AFM, STM - Laser Confocal Microscopy

Includes

Lecture 1:

4.1 ( 11 )


Lecture Details

Advanced Characterization Techniques by Dr. Krishanu Biswas, Prof.N.P.Gurao, Department of Metallurgy and Material Science, IIT Kanpur. For more details on NPTEL visit httpnptel.iitm.ac.in

Ratings

2.3


4 Ratings
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Comments
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Sam

Excellent course helped me understand topic that i couldn't while attendinfg my college.

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Dembe

Great course. Thank you very much.

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