Advanced Characterization Techniques
IIT Kanpur, , Prof. Krishanu Biswas
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Updated On 02 Feb, 19
Introduction to the course: Relevance of advanced characterization to materials development, scientific understanding of phenomena in materials technology - Advanced Diffraction Techniques - Introduction; X-Ray, their production &properties - Review of basic diffraction theory - Various SAXS techniques and its applications in characterizing material - SAXS - GISAXS - LEED and RHEED - EXAFS, SEXAFS/NEXAFS - Properties of neutron radiation; neutron sources - Small angle neutron scattering; Examples - Advanced Surface Characterization Techniques: XPS, AES & SIMS - Importance of surface characterization techniques - Physical principles of XPS, Photoelectric effects - Instrumentation, XPS patterns; Spin orbital Splitting; Quantitative analysis, Chemical effect, Chemical shift, XPS imaging Auger electron generation; Principle, Chemical effect, Quantitative analysis, Depth profiling, Applications - Static and Dynamic Secondary Ion Mass, Common modes of analysis, Depth Profiling, quantitative and Qualitative analysis - Comparison surface analysis techniques - Advanced Spectroscopic Techniques: Introduction; Electromagnetic spectroscopy; UV-Visible Spectroscopy; Photo-luminescence spectroscopy; Infra-red spectroscopy - Raman; STEM; EELS - Advanced Microscopic Techniques:Introduction; Electron-materials interactions - TEM: HR, HAADF, STEM, In-situ TEM - SEM, EBSD, In-situ SEM - AFM, STM - Laser Confocal Microscopy
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Advanced Characterization Techniques by Dr. Krishanu Biswas, Prof.N.P.Gurao, Department of Metallurgy and Material Science, IIT Kanpur. For more details on NPTEL visit httpnptel.iitm.ac.in
Sep 12, 2018
Excellent course helped me understand topic that i couldn't while attendinfg my college.
March 29, 2019
Great course. Thank you very much.