Introduction — Processes and Variation Framework – Semiconductor Process Variation – Mechanical Process Variation – Probability Models of Manufacturing Processes – Probability Models, Parameter Estimation, and Sampling – Sampling Distributions and Statistical Hypotheses – Shewhart SPC and Process Capability – Process Capability and Alternative SPC Methods – Advanced and Multivariate SPC – Yield Modeling – Introduction to Analysis of Variance – Full Factorial Models – Modeling Testing and Fractional Factorial Models – Aliasing and Higher Order Models – Response Surface Modeling and Process Optimization – Process Robustness – Nested Variance Components – Sequential Experimentation – Case Study 1: Tungsten CVD DOE/RSM – Case Study 2: Cycle to Cycle Control – Case Study 3: Spatial Modeling – Case Study 4: Modeling the Embossing/Imprinting of Thermoplastic Layers.

Other Resources

Course Curriculum

Course Reviews


  • 5 stars0
  • 4 stars0
  • 3 stars0
  • 2 stars0
  • 1 stars0

No Reviews found for this course.


FreeVideoLectures Provides you complete information about best courses online, Video tutorials, helps you in building a career !!

Learn More About us All rights reserved.

Setup Menus in Admin Panel