Advanced Characterization Techniques

Overview

Introduction to the course: Relevance of advanced characterization to materials development, scientific understanding of phenomena in materials technology - Advanced Diffraction Techniques - Introduction; X-Ray, their production &properties - Review of basic diffraction theory - Various SAXS techniques and its applications in characterizing material - SAXS - GISAXS - LEED and RHEED - EXAFS, SEXAFS/NEXAFS - Properties of neutron radiation; neutron sources - Small angle neutron scattering; Examples - Advanced Surface Characterization Techniques: XPS, AES & SIMS - Importance of surface characterization techniques - Physical principles of XPS, Photoelectric effects - Instrumentation, XPS patterns; Spin orbital Splitting; Quantitative analysis, Chemical effect, Chemical shift, XPS imaging Auger electron generation; Principle, Chemical effect, Quantitative analysis, Depth profiling, Applications - Static and Dynamic Secondary Ion Mass, Common modes of analysis, Depth Profiling, quantitative and Qualitative analysis - Comparison surface analysis techniques - Advanced Spectroscopic Techniques: Introduction; Electromagnetic spectroscopy; UV-Visible Spectroscopy; Photo-luminescence spectroscopy; Infra-red spectroscopy - Raman; STEM; EELS - Advanced Microscopic Techniques:Introduction; Electron-materials interactions - TEM: HR, HAADF, STEM, In-situ TEM - SEM, EBSD, In-situ SEM - AFM, STM - Laser Confocal Microscopy